Novel Approach for Child and Adulthood Classification Based on Significant Prominent Binary Patterns of Local Maximum Edge (SPBPLME)

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Author(s)

Rajendra Babu .Ch 1,* Sreenivasa Reddy. E 2 Prabhakara Rao. B 3

1. SRK Institute of Technology, Vijayawada, 520008, India

2. ANU College of Engineering & Technology , Guntur, 522510, India

3. JNTUK, Kakinada, 533003, India

* Corresponding author.

DOI: https://doi.org/10.5815/ijitcs.2015.06.04

Received: 3 Oct. 2014 / Revised: 7 Feb. 2015 / Accepted: 11 Mar. 2015 / Published: 8 May 2015

Index Terms

Age Classification, Prominent LBP, LMEBP, SBPLME, Maximum Edge

Abstract

This paper derives a new procedure for age classification of facial image based on the local region of facial image. The local region of facial image is extracted from a Significant Binary Pattern of Local Maximum Edge (SBPLME). The SBPLME is generated by calculating the absolute value of local difference between the average of local 3×3 sub window pixel values and its neighbors instead of the center pixel value. In the case of Local Maximum Edge Binary Pattern (LMEBP) calculating the absolute value of local difference between the center pixel value of local 3×3 sub window and its neighbors. The proposed SBPLME can generate 512 (0 to 511) different patterns. The present paper utilized Prominent LBP (PLBP) on the proposed SBPLME. The PLBP contains the significant patterns of Uniform LBP (ULBP) and Non Uniform LBP (NULBP). Thus the derived Significant PLBP of Local Maximum Edge (SPBPLME) becomes an efficient image classification and analysis, which will have a significant role in many areas. The novelty of the proposed SPBPLME method is, it has shown excellent age classification results by reducing the overall dimension, thus reducing the overall complexity.

Cite This Paper

Rajendra Babu .Ch, Sreenivasa Reddy. E, Prabhakara Rao. B, "Novel Approach for Child and Adulthood Classification Based on Significant Prominent Binary Patterns of Local Maximum Edge (SPBPLME)", International Journal of Information Technology and Computer Science(IJITCS), vol.7, no.6, pp.30-37, 2015. DOI:10.5815/ijitcs.2015.06.04

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