Hongchun Shu

Work place: Kunming University of Science and Technology, Yunnan, China

E-mail: kmshc@sina.com

Website:

Research Interests: Engineering

Biography

Hongchun Shu was born in Jiangsu province, China, in 1961. He received the Ph.D. degree of Power System and Automation from Harbin institute of technology in 1997 and doctoral degree from Xi’an Jiaotong University in 2000. His research directions are novel relay and protection, fault location, DSP’s application, the CTI’s application and reliability research in power system.
He is currently a professor of electric power engineering faculty at Kunming University of Science and Technology, Yunnan, China and Harbin institute of technology, Heilongjiang, China. He is the author of 33 new invention patents, three books and about 100 other publications.
Prof. Shu is a senior member of Electrical Engineering Committee of China, the vice chairman of Yunnan Electrical Engineering Committee, and the editorial board of “Automation of Electric Systems” and “Power System Protection and Control”.

Author Articles
Study on The Novel Transient Bus Protection Based on Morphological Top-bottom-operator

By Hongchun Shu Yuetao Dai Xincui Tian

DOI: https://doi.org/10.5815/ijisa.2011.03.05, Pub. Date: 8 May 2011

A novel transient component bus protection based on mathematical morphology is presented in this paper, which takes the morphological max top-bottom-operator of current traveling wave to fast distinguish the bus internal fault from the external fault. The method is based on the principle that the high frequency component of transient traveling wave caused by bus external fault will be attenuated by the bus capacitance but the traveling wave caused by bus internal fault changes slightly. Simulation is carried out with the electromagnetic transient simulation software PSCAD/EMTDC, the result verifies the bus protection is reliable and accurate. The novel bus protection also can treat lightning failure or lightning disturbance happened on transmission lines as bus external fault, without malfunction.

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